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Keck LEO-1550 SEM
(NBTC and CCMR)
The Keck field emission Scanning
Electron Microscope (SEM) operates from 100eV up to 30keV, with a
resolution of 1nm at 20keV and 2.5nm at 5 keV. Due to its electron
optical design it produces superb images, particularly at low
accelerating voltages. Upgrades soon to be in place will double the
efficiency of the in-lens secondary electron detector, add a new
four-quadrant backscattered detector, and add a cooling/heating stage
(-185C / 400C). This instrument is used by researchers in a wide
variety of disciplines, including physics, materials science, biology,
chemistry, and electrical engineering.
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